Browse by UCL Departments and Centres
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Group by: Author | Type
Number of items: 11.
A
| Al-Angari, AA and Kennerely, JW and Newton, JM (1985) Compaction properteis of polyethylene glycols. Journal of Pharmacy and Pharmacology , 37 151 - 153. |
B
| Bond, LJ and Georgiou, G and Punjani, M and Saffari, N (1985) Finite-Difference Modelling and Visualisation of Pulsed Ultrasonic waves. In: (Proceedings) Ultrasonics International. Butterworth: Guildford. |
| Buckton, G and Newton, JM (1985) Assessment of the wettability and surface energy of a pharmaceutical powder by liquid penetration. Journal of Pharmacy and Pharmacology , 37 (9) 605 - 609. |
C
| Charlton, B and Newton, JM (1985) Application of gamma-ray attenuation to the determination of density distributions within compacted powders. Powder Technology , 41 (2) 123 - 134. |
F
| French, P and Bond, LJ and Saffari, N (1985) Computer Assisted Ultrasonic NDT. In: (Proceedings) Ultrasonics International. Butterworth: Guildford. |
G
| Gostelow, C and Cocker, R and Saffari, N and Bond, LJ (1985) Improved Ultrasonic Methods for Gas Turbine NDE. In: Thompson, DO and Chimenti, DE, (eds.) (Proceedings) Review of Progress in Quantitative NDE. (pp. 145 - 148). Plenum Press: New York and London. |
H
| Harrison, PJ and Newton, JM and Rowe, RC (1985) Flow defects in wet powder mass extrusion. Journal of Pharmacy and Pharmacology , 37 (2) 81 - 83. |
| Harrison, PJ and Newton, JM and Rowe, RC (1985) The characterization of wet powder masses suitable for extrusion/spheronization. Journal of Pharmacy and Pharmacology , 37 (10) 686 - 691. |
J
| James, MB and Newton, JM (1985) The influence of surface topography on the dynamic friction between acetylsalicyclic acid compacts and steel. Journal of Materials Science , 20 (4) 1333 - 1340. |
S
| Saffari, N and Bond, LJ (1985) Leaky Rayleigh Waves for Defect Characterisation. In: (Proceedings) Ultrasonics International. (pp. 73 - 78). Butterworth: Guildford. |
| SAFFARI, N and BOND, LJ (1985) MODE-CONVERSION PHENOMENA AT SURFACE-BREAKING CRACKS FOR DEFECT CHARACTERIZATION. IEEE T SON ULTRASON , 32 (1) 97 - 97. |


