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Group by: Author | Type
Jump to: A | B | L | Y | Z
Number of items: 9.

A

Androutsopoulos, K; Clark, D; Harman, M; Li, Z; Tratt, L; (2009) Control Dependence for Extended Finite State Machines. In: Chechik, M and Wirsing, M, (eds.) FUNDAMENTAL APPROACHES TO SOFTWARE ENGINEERING, PROCEEDINGS. (pp. 216 - 230). SPRINGER-VERLAG BERLIN

Androutsopoulos, K; Clark, D; Harman, M; Li, Z; Tratt, L; (2009) Control Dependence for Extended Finite State Machines. In: Chechik, M and Wirsing, M, (eds.) FUNDAMENTAL APPROACHES TO SOFTWARE ENGINEERING, PROCEEDINGS. (pp. 216 - 230). SPRINGER-VERLAG BERLIN

Androutsopoulos, K; Gold, N; Harman, M; Li, Z; Tratt, L; (2009) A Theoretical and Empirical Study of EFSM Dependence. In: 2009 IEEE INTERNATIONAL CONFERENCE ON SOFTWARE MAINTENANCE, CONFERENCE PROCEEDINGS. (pp. 287 - 296). IEEE COMPUTER SOC

Androutsopoulos, K; Gold, N; Harman, M; Li, Z; Tratt, L; (2009) A Theoretical and Empirical Study of EFSM Dependence. In: 2009 IEEE INTERNATIONAL CONFERENCE ON SOFTWARE MAINTENANCE, CONFERENCE PROCEEDINGS. (pp. 287 - 296). IEEE COMPUTER SOC

B

Bao, CH; Gold, N; Harman, M; (2009) Maintaining WS-BPEL Using Aspects. In: Witold, A and Maciaszek, LA and Kowalczyk, R and Speck, A, (eds.) Business Process, Services Computing and Intelligent Service Management. (pp. 225 - 226).

L

Lakhotia, K; McMinn, P; Harman, M; (2009) Automated Test Data Generation for Coverage: Haven't We Solved This Problem Yet? 2009 TESTING: ACADEMIC AND INDUSTRIAL CONFERENCE-PRACTICE AND RESEARCH TECHNIQUES, TAIC PART 2009 95 - 104. 10.1109/TAICPART.2009.15.

Lakhotia, K; McMinn, P; Harman, M; (2009) Automated Test Data Generation for Coverage: Haven’t We Solved This Problem Yet? In: Testing: Academic and Industrial Conference - Practice and Research Techniques, 2009. TAIC PART ’09. (pp. 95 -104 - 95 -104).

Y

Yoo, S; Harman, M; Ur, S; (2009) Measuring and Improving Latency to Avoid Test Suite Wear Out. In: Proceedings of the Interntional Conference on Software Testing, Verification and Validation Workshop (ICSTW 2009). (pp. 101-110 - 101-110). IEEE Computer Society Press

Z

Zhao, R; Li, Z; (2009) Boundary Value Testing Using Integrated Circuit Fault Detection Rule. In: TAIC-PART ’09: Proceedings of the 2009 Testing: Academic and Industrial Conference - Practice and Research Techniques. (pp. 3 - 12). IEEE Computer Society: Washington, DC, USA.

This list was generated on Sun Sep 21 05:55:39 2014 BST.